发明名称 SEMICONDUCTOR DEVICE WITH TRENCH ISOLATION STRUCTURE AND METHOD FOR FABRICATING THE SAME
摘要 The present invention relates to a semiconductor device with a device isolation structure and a method for fabricating the same. The semiconductor device includes: a substrate provided with a trench formed in the substrate; and at least one device isolation structure including an oxide layer formed on the trench, a nitride layer formed on the oxide layer disposed on sidewalls of the trench and a high density plasma oxide layer formed on the nitride layer to fill the trench.
申请公布号 US2009189243(A1) 申请公布日期 2009.07.30
申请号 US20090419102 申请日期 2009.04.06
申请人 LIM JAE-EUN;HWANG SUN-HWAN 发明人 LIM JAE-EUN;HWANG SUN-HWAN
分类号 H01L21/76;H01L29/06;H01L21/762 主分类号 H01L21/76
代理机构 代理人
主权项
地址