Method for fully automatic and high-resolution scanning of raw technical surfaces, involves detecting arbitrarily fixed quantity with any number of successively provided recording arrangements at surface areas

摘要

The method involves detecting an arbitrarily fixed quantity with any number of successively provided recording arrangements at surface areas in fully automatic manner in the lighting half space. The position of the lighting and sensors is changed between scanning procedures against the measuring object and together temporarily between the scanning procedures in completely automatic manner. An independent claim is included for a device for fully automatic and high-resolution scanning of raw technical surfaces for the detection of structural surfaces and material properties by gradually and flexibly defined position change of lighting and sensors in lighting half space.