| 摘要 |
PROBLEM TO BE SOLVED: To provide a contact probe easily manufactured, low in cost, suitable for the inspection of a compact circuit board of high integration, and capable of springing an electrode terminal with moderate biasing force even if reducing the diameter of the contact probe to about 50μm. SOLUTION: The contact probe for making a predetermined electrical inspection by inserting the electrode terminal in an inspection hole of the circuit board, has the electrode terminal 2 of a predetermined length, and a pipe 3 mounted in close contact with the outer periphery of the electrode terminal 2 so that at least one end of the electrode terminal 2 projects by a predetermined length. The pipe 3 is formed as an elasticity adjusting pipe for adjusting flexural elasticity of the electrode terminal 2 by a combination of forming conditions including wall thickness, length and material. An extra-fine pipe 3 of≤100μm can be formed by electroforming. COPYRIGHT: (C)2009,JPO&INPIT
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