发明名称
摘要 <p>PROBLEM TO BE SOLVED: To achieve a phantom calibration using a single phantom with a multislice type CT system. SOLUTION: A single phantom is set on a cradle and the cradle is moved to perform a scout scanning from sideways and separately calculates the positions of the cradle at which the single phantom is adaptable to a first detector train 241 and a second detector train 242 of a multiple detector 24 based on a lateral scout image 711 obtained. Then, the cradle is moved to the respective positions to perform a phantom calibration of the first detector train 241 and the second detector train 242. This eliminates the need for a phantom for heavy multiple operation to reduce a burden on management and working of an operator and also minimizes the inclination of the phantom thereby reducing errors.</p>
申请公布号 JP4305692(B2) 申请公布日期 2009.07.29
申请号 JP19990102053 申请日期 1999.04.09
申请人 发明人
分类号 A61B6/03 主分类号 A61B6/03
代理机构 代理人
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