发明名称 |
RESISTIVE RANDOM ACCESS MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
<p>A resistive memory device is provided to prevent thermal degradation of a diode and a resistance change layer by including a protecting layer. A resistive memory device includes a storage node, a switching device, and a protecting layer(140). The storage node includes a resistance change layer(110). The switching device is connected to the storage node. The protecting layer covers a part exposed of the resistance change layer, is made of material which does not a silicide reaction with the resistance change layer, is a material layer which prevents hydrogen permeation, and includes at least one among aluminum oxide and titanium oxide. The resistance change layer is a metal oxide layer.</p> |
申请公布号 |
KR20090080751(A) |
申请公布日期 |
2009.07.27 |
申请号 |
KR20080006702 |
申请日期 |
2008.01.22 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, KI HWAN;PARK, YOUNG SOO;LEE, MYOUNG JAE;WENXU XIANYU;AHN, SEUNG EON;LEE, CHANG BUM |
分类号 |
H01L27/115 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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