发明名称 CURRENT SAMPLING METHOD AND CIRCUIT
摘要 <P>PROBLEM TO BE SOLVED: To provide a current sampling method and circuit for giving shorter sampling times. <P>SOLUTION: A current sampling circuit includes: a current sampling transistor; a capacitor arranged between the gate and source of the current sampling transistor; and an amplifier for providing a feedback loop between the gate and source of the current sampling transistor. A switch controls the circuit to sample a gate-source voltage corresponding to a current being sampled on the capacitor. The capacitor includes a first capacitor circuit for sampling a gate source voltage in a first sampling period and a second capacitor circuit. The first and second capacitor circuits are connected in series for sampling the gate source voltage in a second sampling period. The operating point of the amplifier is shifted between the first and second periods based on the gate source voltage to be sampled in the first sampling period. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009159610(A) 申请公布日期 2009.07.16
申请号 JP20080331367 申请日期 2008.12.25
申请人 TOPPOLY OPTOELECTRONICS CORP 发明人 BRAMANTE NICOLA;EDWARDS MARTIN;AYRES JOHN RICHARD ALAN
分类号 H03F3/70 主分类号 H03F3/70
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