发明名称 TANDEM TIME-OF-FLIGHT TYPE MASS SPECTROMETRY
摘要 PROBLEM TO BE SOLVED: To provide a new TOF/TOF measuring method free from defects in a conventional TOF/TOF measuring method. SOLUTION: In a method of selecting and splitting each of isotopic ions by an ion gate and measuring spectra of product ions, the method comprises: a first step of finely controlling the acceleration voltage of a time-of-flight type mass spectrometer and/or a setting voltage of a time-of-flight type ion optical system so that each isotopic ion can fly through the first time-of-flight mass spectrometer in the same time-of-flight, consequently making the time of flight of respective isotopic ions identical independently of their mass differences, and thus obtaining the spectrum of respective product ions; a second step of synthesizing an entire product ion spectrum by superimposing and adding the obtained product ion spectra coming from isotopic ions by the same time of flight; and a third step of converting the time-of-flight axis of the synthesized product ion spectrum into a mass axis. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009158106(A) 申请公布日期 2009.07.16
申请号 JP20070331405 申请日期 2007.12.25
申请人 JEOL LTD 发明人 SATO TAKAHISA
分类号 H01J49/40;G01N27/62;G01N27/64;H01J49/10 主分类号 H01J49/40
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