| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit device having high reliability. SOLUTION: This semiconductor integrated circuit device in one mode is equipped with the first chip 2 having an internal circuit 4; the second chip 3 accessible only through the first chip 2; a test processing circuit 5 connected electrically to the internal circuit 4 in the first chip 2, for testing the second chip 3 by accessing the second chip 3 from an external terminal 11; a test circuit 6 wherein an input/output buffer of a signal accessing the second chip 3 is disposed in the test processing circuit 5; a bypass line BL14 disposed by detouring the input/output buffer in the test processing circuit 5, to transmit the signal from the first chip 2 to the second chip 3; and a switching means 51 between a signal transfer route via the input/output buffer and a signal transfer route via the bypass line. COPYRIGHT: (C)2009,JPO&INPIT
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