发明名称 |
SEMICONDUCTOR DEVICE AND CAPACITANCE VALUE CALCULATION METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device with a region occupied by a decoupling capacitance optimized. SOLUTION: The semiconductor device 21 includes: instances 32a to 32c connected between a first power line LH and a second power line LL; and the decoupling capacitance 33 connected between the first power line LH and the second power line LL. A wiring LS to propagate a signal is connected to the instances 32a to 32c. The capacitance value of the decoupling capacitance 33 is of a capacitance value based on an allowable delay variation depending on the period from a change in input signal to a change in output signal of the wiring LS, and the allowable voltage variation depending on the voltage between the first power line LH and the second power line LL. COPYRIGHT: (C)2009,JPO&INPIT
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申请公布号 |
JP2009158566(A) |
申请公布日期 |
2009.07.16 |
申请号 |
JP20070332298 |
申请日期 |
2007.12.25 |
申请人 |
FUJITSU MICROELECTRONICS LTD |
发明人 |
OKUMURA TAKAMASA |
分类号 |
H01L21/822;G06F17/50;H01L21/82;H01L27/04 |
主分类号 |
H01L21/822 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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