发明名称 NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a device which is excellent in the control property of drain voltage by improving stability in control of applied voltage of a memory cell in a nonvolatile semiconductor memory device. <P>SOLUTION: The nonvolatile semiconductor memory device includes: a plurality of memory cells; a write buffer to which data to be written into the plurality of memory cells are input; a count circuit in which data input to the write buffer is searched and the number of bits of data programmed simultaneously to the plurality of memory cells is decided; a write circuit providing write voltage to the plurality of memory cells in accordance with the data; and a voltage regulator outputting a voltage Vpb for control to the write circuit, wherein, the voltage regulator includes a control means in which a dummy current circuit is connected to the output of the voltage regulator, the dummy current quantity of the dummy current circuit is controlled in accordance with the number of bits of write, and the current supply quantity of voltage regulator is controlled to be fixed. <P>COPYRIGHT: (C)2009,JPO&INPIT</p>
申请公布号 JP2009157995(A) 申请公布日期 2009.07.16
申请号 JP20070334111 申请日期 2007.12.26
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 SUDO NAOAKI
分类号 G11C16/02;G11C16/06 主分类号 G11C16/02
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