| 摘要 |
PROBLEM TO BE SOLVED: To avoid increase in test time due to the increase in the number of clocks of a pattern generator necessary for testing. SOLUTION: A semiconductor device includes a test object circuit (700), scan chains (650) that enable scanning of the test object circuit, and a first random generation circuit (100) that forms a test pattern supplied to the scan chains. The semiconductor device includes a second random generation circuit (200), provided separately from the first random generation circuit, and a random control circuit for changing the random generated in the first random generation circuit, by using the random generated by the second random generation circuit. In the test of the semiconductor device, since the clock of the scan chain need not be longer than the cycle of the clock of the pattern generator, increase in the number of the clocks of the pattern generator necessary for the test is avoided, and thereby the test time is avoided from increasing. COPYRIGHT: (C)2009,JPO&INPIT
|
