| 摘要 |
PROBLEM TO BE SOLVED: To provide a substrate inspecting fixture having simple structure and a small inner resistance, and an inspecting contact element used in the substrate inspecting jig. SOLUTION: The substrate inspecting fixture is adapted to electrically connect a body of a substrate inspecting device to a plurality of inspecting points provided on a wiring pattern on a substrate to be inspected. The substrate inspecting fixture includes a rod-like conductive contact element having both ends for electrical continuity, one end being brought into press contact with the inspecting point, a contact element holding body for holding the contact element, and a connection electrode body having an electrode section disposed to face the other end of the contact element. The contact element includes a conductive coil spring and a conductive rod-like member that is thread into the coil spring and is conductively connected to the coil spring. The electrode section is formed of a conductive hollow member whose one end is opened. When the contact element and the electrode section are used by bring them into contact with each other, the coil spring is in continuity contact with an outer surface of the hollow member, and a partial surface of the rod-like member of the contact element is allowed to slide on the inner surface of the hollow member. COPYRIGHT: (C)2009,JPO&INPIT
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