发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND METHOD OF FABRICATING THE SAME
摘要 A semiconductor integrated circuit device and a manufacturing method thereof are provided to increase intensity of semiconductor chip and substrate by burying inside of a grinding mark with a buried film and forming the grinding mark in a longitudinal direction of a semiconductor chip. A semiconductor integrated circuit device includes a substrate(100), a grinding mark and a buried film. The grinding mark is recessed to be formed at a bottom surface of the substrate. The grinding mark is extended in one direction. The buried film buries the recess region of the grinding mark.
申请公布号 KR20090077539(A) 申请公布日期 2009.07.15
申请号 KR20080003548 申请日期 2008.01.11
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, YO JONG
分类号 H01L21/304;H01L21/316;H01L21/318 主分类号 H01L21/304
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