发明名称 |
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND METHOD OF FABRICATING THE SAME |
摘要 |
A semiconductor integrated circuit device and a manufacturing method thereof are provided to increase intensity of semiconductor chip and substrate by burying inside of a grinding mark with a buried film and forming the grinding mark in a longitudinal direction of a semiconductor chip. A semiconductor integrated circuit device includes a substrate(100), a grinding mark and a buried film. The grinding mark is recessed to be formed at a bottom surface of the substrate. The grinding mark is extended in one direction. The buried film buries the recess region of the grinding mark.
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申请公布号 |
KR20090077539(A) |
申请公布日期 |
2009.07.15 |
申请号 |
KR20080003548 |
申请日期 |
2008.01.11 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, YO JONG |
分类号 |
H01L21/304;H01L21/316;H01L21/318 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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