发明名称 Sliding error sampler (SES) for latency reduction in the ADC path
摘要 A digital control loop within power switchers and the like includes a sliding error sampler analog-to-digital converter producing an error value for a digital loop iteration. A predictor variably sets the timing for initiating analog-to-digital conversion of the current error value based on the magnitude of a previous error value for a previous loop iteration, plus margins conversion housekeeping and the step size of the next loop iteration. At a timing prior to a filter reading the error value that equals the number of clock cycles set by the predictor, a timing unit triggers the analog-to-digital conversion, reducing loop latency and improving performance.
申请公布号 US7561084(B1) 申请公布日期 2009.07.14
申请号 US20070904017 申请日期 2007.09.25
申请人 NATIONAL SEMICONDUCTOR CORPORATION 发明人 WONG HEE
分类号 H03M1/00 主分类号 H03M1/00
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