发明名称 DRAM layout with vertical FETs and method of formation
摘要 DRAM cell arrays having a cell area of less than about 4 F2 comprise an array of vertical transistors with buried bit lines and vertical double gate electrodes. The buried bit lines comprise a silicide material and are provided below a surface of the substrate. The word lines are optionally formed of a silicide material and form the gate electrode of the vertical transistors. The vertical transistor may comprise sequentially formed doped polysilicon layers or doped epitaxial layers. At least one of the buried bit lines is non-orthogonal to at least one of the vertical gate electrodes of the vertical transistors.
申请公布号 US7560336(B2) 申请公布日期 2009.07.14
申请号 US20060328150 申请日期 2006.01.10
申请人 MICRON TECHNOLOGY, INC. 发明人 ABBOTT TODD R.
分类号 H01L21/336;H01L21/20;H01L21/8242 主分类号 H01L21/336
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