发明名称 Fabrication method of trench capacitor
摘要 A method of fabricating trench capacitors is provided. A plurality of trenches is formed in the substrate by performing a patterning process with a patterned mask layer on a substrate. A bottom electrode is formed in the substrate of the surface of the trench. A portion of the patterned mask layer is removed so as to expose a portion of the substrate at two sides of the top of the trench. A capacitor dielectric layer is formed on the substrate and the surface of the trench. A conductive layer is formed over the substrate. The conductive layer is at least filled into the trench and covers the capacitor dielectric layer. The patterned mask layer and a portion of the conductive layer are removed and the portion of the conductive layer which covers the capacitor dielectric layer is reserved as to form a top electrode.
申请公布号 US7560356(B2) 申请公布日期 2009.07.14
申请号 US20070954201 申请日期 2007.12.11
申请人 UNITED MICROELECTRONICS CORP. 发明人 LEE RICHARD
分类号 H01L21/20 主分类号 H01L21/20
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