发明名称 Apparatus and method for testing and debugging an integrated circuit
摘要 An integrated circuit (IC) comprises an embedded processor. An embedded in-circuit emulator (ICE) emulates at least one function of the embedded processor, performs at least one of testing and debugging on the IC, and generates testing results based on the at least one of the testing and the debugging. A serializer located on the IC receives the testing results from at least one of the embedded ICE and the embedded processor, serializes the testing results, and serially outputs the testing results from the IC.
申请公布号 US7562276(B1) 申请公布日期 2009.07.14
申请号 US20070800614 申请日期 2007.05.07
申请人 MARVELL INTERNATIONAL LTD. 发明人 AZIMI SAEED;HO SON
分类号 G01R31/28 主分类号 G01R31/28
代理机构 代理人
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