发明名称 Semiconductive device fabricated using a raised layer to silicide the gate
摘要 In one aspect, the invention provides a method of fabricating a semiconductive device 200 that comprises forming a raised layer [510] adjacent a gate [340] and over a source/drain [415], depositing a silicidation layer [915] over the gate [340] and the raised layer [510], and moving at least a portion of the silicidation layer [915] into the source/drain [415] through the raised layer [510].
申请公布号 US7560379(B2) 申请公布日期 2009.07.14
申请号 US20060348835 申请日期 2006.02.07
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 KOHLI PUNEET;RAMIN MANFRED B.
分类号 H01L21/4763;H01L21/28;H01L21/44 主分类号 H01L21/4763
代理机构 代理人
主权项
地址