发明名称 |
Semiconductive device fabricated using a raised layer to silicide the gate |
摘要 |
In one aspect, the invention provides a method of fabricating a semiconductive device 200 that comprises forming a raised layer [510] adjacent a gate [340] and over a source/drain [415], depositing a silicidation layer [915] over the gate [340] and the raised layer [510], and moving at least a portion of the silicidation layer [915] into the source/drain [415] through the raised layer [510].
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申请公布号 |
US7560379(B2) |
申请公布日期 |
2009.07.14 |
申请号 |
US20060348835 |
申请日期 |
2006.02.07 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
KOHLI PUNEET;RAMIN MANFRED B. |
分类号 |
H01L21/4763;H01L21/28;H01L21/44 |
主分类号 |
H01L21/4763 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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