发明名称 Method for memory testing
摘要 A method for memory testing implemented on an embedded system, the method comprising steps of loading a booting program when the embedded system is booted; activating a RAM of the embedded system by the booting program; duplicating the booting program itself and writing the duplicated booting program into a first section of the RAM by the booting program; downloading a testing program from an on-line source and writing the downloaded testing program into a second section of the RAM by the duplicated booting program; and enabling the downloaded testing program to check a third section the rest part of the RAM excepting the first and second sections, after the downloaded testing program is executed by the duplicated booting program.
申请公布号 US2009177925(A1) 申请公布日期 2009.07.09
申请号 US20080007115 申请日期 2008.01.07
申请人 INVENTEC CORPORATION 发明人 CHEN CHI-YUAN CHU
分类号 G06F11/22;G06F11/26 主分类号 G06F11/22
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