发明名称 Method of Measuring Peripheral Tilt Angle, Method and Device for Inspecting Inspection Object Having Surface Mounds, Method of Determining Position of Illumination Means, Irregularity Inspection Device, and Light Source Position Determining Device
摘要 The method of measuring a peripheral tilt angle in accordance with the present invention, to address the problems, is a method of measuring a peripheral tilt angle on an inspection object having surface mounds, the method including: the step A of projecting light onto the inspection object; the step B of sensing distribution of light reflected off the inspection object; the step C of obtaining a feature point of the distribution of the reflected light from result of the sensing of the distribution of the reflected light; and the step D of obtaining a peripheral tilt angle which is a tilt angle near a periphery of each of the surface mounds based on an angle of projection of the light in step A to a position which, on the inspection object, corresponds to the feature point and an angle of sensing of the reflected light in step B off a position which, on the inspection object, corresponds to the feature point. Thus, the invention provides a method whereby a peripheral tilt angle, or a tilt angle of a surface mound near its periphery on an inspection object is obtained and also provides a method whereby deviation in height of the surface mound is precisely inspected based on the peripheral tilt angle.
申请公布号 US2009177428(A1) 申请公布日期 2009.07.09
申请号 US20070227562 申请日期 2007.06.12
申请人 SHARP KABUSHIKI KAISHA 发明人 IDEN TAMON
分类号 G01P21/00;G01B11/26;G01B11/30 主分类号 G01P21/00
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