发明名称 METHOD FOR DETECTING PATTERN OF OVER-SAMPLING IMAGE AND AN OPTICAL INFORMATION PROCESSING APPARATUS AND METHOD USING THE SAME
摘要 <p>Provided are a method for detecting a pattern of an over-sampling image and an optical information processing apparatus and method using the same. A method for detecting a pattern from an image of an over-sampled datapage includes: over-sampling the datapage to detect a detection image of the datapage; comparing the detection image and a reference image of over-sampling for the pattern by a covariance; and calculating a pixel of the pattern over-sampled by values of the reference image and the detection image compared by the covariance. Accordingly, data with a specific pattern such as a mark can be detected from an image of an over-sampled datapage, thereby making it possible to increase the data reproduction accuracy, thus making it possible to greatly increase the reliability of reproduced optical data.</p>
申请公布号 WO2009084845(A2) 申请公布日期 2009.07.09
申请号 WO2008KR07612 申请日期 2008.12.23
申请人 DAEWOO ELECTRONICS CORPORATION;KIM, NAK YOUNG;YOON, PIL SANG;JUNG, KYU IL 发明人 KIM, NAK YOUNG;YOON, PIL SANG;JUNG, KYU IL
分类号 G11B7/0065 主分类号 G11B7/0065
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