发明名称 METHOD OF VERIFYING PROGRAMMING OPERATION OF FLASH MEMORY DEVICE
摘要 A method is provided for verifying a programming operation of a flash memory device. The flash memory device includes at least one memory string in which a string selection transistor, multiple memory cells and a ground selection transistor are connected in series, and the programming operation is performed with respect to a selected memory cell in the memory string. The method includes applying a voltage, obtained by adding a threshold voltage of the string selection transistor to a power supply voltage, to a string selection line connected to the string selection transistor; applying a ground voltage to wordlines connected to each of the memory cells and a ground selection line connected to the ground selection transistor; precharging a bitline connected to the memory string to the power supply voltage; and determining whether a programming operation of the selected memory cell is complete.
申请公布号 US2009175087(A1) 申请公布日期 2009.07.09
申请号 US20080247288 申请日期 2008.10.08
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK MIN-GUN;LEE JIN-YUB
分类号 G11C16/06 主分类号 G11C16/06
代理机构 代理人
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