发明名称 APPARATUS AND METHOD FOR PROCESSING A SUBSTRATE USING INDUCTIVELY COUPLED PLASMA TECHNOLOGY
摘要 <p>The present invention generally provides apparatus and methods for processing a semiconductor substrate. Particularly, the present invention provides an inductively coupled plasma reactor having improved process uniformity. One embodiment of the present invention provides an apparatus for processing a substrate comprising a chamber body defining a process volume configured to process the substrate therein, an adjustable coil assembly coupled to the chamber body outside the process volume, a supporting pedestal disposed in the process volume and configured to support the substrate therein, and a gas injection assembly configured to supply a process gas towards a first process zone and a second process zone independently.</p>
申请公布号 WO2009085808(A2) 申请公布日期 2009.07.09
申请号 WO2008US87134 申请日期 2008.12.17
申请人 APPLIED MATERIALS, INC.;SWENBERG, JOHANES S.;LIU, WEI;NGUYEN, HANH D.;NGUYEN, SON T.;CURTIS, ROGER;BOTTINI, PHILIP A.;MARK, MICHAEL J.;GUARINI, THERESA KRAMER;CHOI, WOONG 发明人 SWENBERG, JOHANES S.;LIU, WEI;NGUYEN, HANH D.;NGUYEN, SON T.;CURTIS, ROGER;BOTTINI, PHILIP A.;MARK, MICHAEL J.;GUARINI, THERESA KRAMER;CHOI, WOONG
分类号 H05H1/34;H01L21/30 主分类号 H05H1/34
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