发明名称 Verfahren zur Erzeugung von tomographischen Schnittbildern von einem Untersuchungsobjekt mit mindestens zwei winkelversetzten Strahlenbündeln und Computertomographie-Gerät zur Durchführung dieses Verfahrens
摘要 A method is disclosed for production of tomographic slice images of an examination object using a computed tomography scanner. In order to scan an examination object, at least two X-ray beams are produced, which each are at offset angles and fan out from a focus to an opposite detector and scan the examination object. The scans at least partially overlap. Detector output data which is emitted from the detector elements is measured together with physical orientation data of the beams and is converted to projection data sets. Slice images are then calculated. In order to calculate the complete slice images, data which is redundant from the measured data of the at least two X-ray beams from overlapping projection intervals is used for each complete slice image. The size of the overlap area of the projection data used from the individual X-ray beams is defined before the calculation of the slice images, in order to vary time resolution and image quality.
申请公布号 DE102004042491(B4) 申请公布日期 2009.07.09
申请号 DE20041042491 申请日期 2004.08.31
申请人 SIEMENS AG 发明人 SCHALLER, STEFAN;BRUDER, HERBERT
分类号 G01N23/06;A61B6/03 主分类号 G01N23/06
代理机构 代理人
主权项
地址