摘要 |
<p>The present invention relates to an integrally formed probe pin, more particularly, to the probe pin which enables both sides or one side of connecting port to connect the coil spring by cutting and bending the body as a part of the pin using the progressive die, to generate elasticity for testing smoothly. And the fabricating method of the probe pin comprising, cutting a body so that an upper contact part 101, a lower contact part 102, and an elastic spring part 103 may be formed in one body 100; burning a coil spring 106 for an elastic spring part 103 to have the elastic force; molding a lower port for a lower contact part 102 to be formed roundly; bending the elastic spring part 103 to the inner side of the body 100; finishing that the upper contact part 101 may be rolled smaller than an external diameter of the body 100 and projected after molding the body 100 roundly. The present invention provides the effect of reducing the fabricating time remarkably and lowering of the production cost due to needlessness of the fabricating time, in addition, mass production may be possible and it improves the electric characteristic by fabricating the probe pin in one body.</p> |