发明名称 BONDING STRENGTH MEASURING DEVICE
摘要 A bonding strength measuring device for measuring the bonding strength between a substrate and a molding compound disposed on the substrate is provided. The measuring device includes a heating platform, a heating slide plate, and a fixing bracket. The heating platform has a first heating area and a first replaceable fixture. The substrate is disposed on the first heating area, and the first replaceable fixture is used to fix the substrate and has an opening exposing the molding compound. The heating slide plate has a second heating area and a second replaceable fixture. The second heating area is used to heat the molding compound, and the second replaceable fixture has a cavity for accommodating the molding compound. The fixing bracket is used to fix the heating slide plate above the heating platform.
申请公布号 US2009175312(A1) 申请公布日期 2009.07.09
申请号 US20090350643 申请日期 2009.01.08
申请人 ADVANCED SEMICONDUCTOR ENGINEERING, INC. 发明人 LAI YI-SHAO;TSAI TSUNG-YUEH;CHANG HSIAO-CHUAN
分类号 G01N3/00 主分类号 G01N3/00
代理机构 代理人
主权项
地址