发明名称 TIME-SLOPED CAPACITANCE MEASURING CIRCUITS AND METHODS
摘要 <p>Time-sloped capacitance measuring circuits use the time to ramp voltage signals between reference levels to determine an unknown capacitance, where the ramping time is determined by the cumulative whole number of clock cycles counted during voltage signal ramping over multiple ramp cycles. Measurement resolution can be improved by adjusting a starting voltage level for subsequent voltage signal ramps by an amount that compensates for incremental voltage ramping during a terminal clock cycle of a previous voltage signal ramp.</p>
申请公布号 WO2009085656(A2) 申请公布日期 2009.07.09
申请号 WO2008US86580 申请日期 2008.12.12
申请人 3M INNOVATIVE PROPERTIES COMPANY 发明人 GEAGHAN, BERNARD O.
分类号 G01R27/26;G01R27/02 主分类号 G01R27/26
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