发明名称 |
SEMICONDUCTOR SUBSTRATE AND METHOD FOR MANUFACTURING SEMICONDUCTOR SUBSTRATE |
摘要 |
<p>Disclosed is a high-quality GaAs crystalline thin film wherein a low-cost Si substrate having excellent heat dissipating characteristics is used. The semiconductor substrate is provided with a single crystal Si substrate, an insulating layer which is formed on the substrate and has an opening region, a Ge layer epitaxially grown on the substrate in the opening region, and a GaAs layer epitaxially grown on the Ge layer. The Ge layer is formed by introducing the substrate into a CVD reaction chamber which can be brought into an ultrahigh vacuum depressurized state, performing first epitaxial growth at a first temperature at which a material gas can be thermally decomposed, performing second epitaxial growth at a second temperature higher than the first temperature, performing first annealing to the epitaxial layer formed by the first and the second epitaxial growth, at a third temperature not reaching the melting point of Ge, and performing second annealing at a fourth temperature lower than the third temperature.</p> |
申请公布号 |
WO2009084242(A1) |
申请公布日期 |
2009.07.09 |
申请号 |
WO2008JP04041 |
申请日期 |
2008.12.26 |
申请人 |
SUMITOMO CHEMICAL COMPANY, LIMITED;THE UNIVERSITY OF TOKYO;TAKADA, TOMOYUKI;YAMANAKA, SADANORI;HATA, MASAHIKO;YAMAMOTO, TAKETSUGU;WADA, KAZUMI |
发明人 |
TAKADA, TOMOYUKI;YAMANAKA, SADANORI;HATA, MASAHIKO;YAMAMOTO, TAKETSUGU;WADA, KAZUMI |
分类号 |
H01L21/205;H01L21/20;H01L21/331;H01L21/338;H01L29/26;H01L29/737;H01L29/778;H01L29/812 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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