发明名称 |
GALLIUM NITRIDE SUBSTRATE, SUBSTRATE WITH EPITAXIAL LAYER, SEMICONDUCTOR DEVICE, AND METHOD OF MANUFACTURING GALLIUM NITRIDE SUBSTRATE |
摘要 |
PROBLEM TO BE SOLVED: To provide a GaN substrate with a large diameter of two inches or more, which allows a semiconductor device such as a light-emitting element with improved characteristics such as luminance efficiency and operating life to be obtained at low cost industrially; a substrate with an epitaxial layer, which has an epitaxial layer formed on the main surface of the GaN substrate; a semiconductor device; and to provide a method of manufacturing the GaN substrate. SOLUTION: A GaN substrate 1 has a main surface, and includes a low-defect crystal region 52 and a defect-concentrated region 51 adjacent to the low-defect crystal region 52. The low-defect crystal region 52 and the defect-concentrated region 51 extend from the main surface to a backside located on the opposite side of the main surface. A plane direction [0001] is tilted in an off-angle direction with respect to a normal vector of the main surface. COPYRIGHT: (C)2009,JPO&INPIT
|
申请公布号 |
JP2009152511(A) |
申请公布日期 |
2009.07.09 |
申请号 |
JP20070340635 |
申请日期 |
2007.12.28 |
申请人 |
SUMITOMO ELECTRIC IND LTD |
发明人 |
OSADA HIDEKI;KASAI HITOSHI;ISHIBASHI KEIJI;NAKAHATA SEIJI;KYONO TAKASHI;AKITA KATSUSHI;MIURA YASUNORI |
分类号 |
H01L21/205;C23C16/34;H01S5/343 |
主分类号 |
H01L21/205 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|