发明名称 WAVE FRONT ABERRATION INSPECTION APPARATUS, OPTICAL PICKUP ASSEMBLY ADJUSTMENT DEVICE, AND OBJECTIVE LENS ACTUATOR ASSEMBLY ADJUSTMENT DEVICE
摘要 PROBLEM TO BE SOLVED: To highly accurately inspect wave front aberration of an optical pickup in a short time. SOLUTION: A first collimator lens 101 converts a first emission beam emitted from a first objective lens 201 of an optical pickup 16 into a parallel beam, a second collimator lens 102 converts a second emission beam emitted from a second objective lens 202 of the optical pickup 16 into a parallel beam, a wave front detecting part 6 detects wave front aberration of the first emission beam and wave front aberration of the second emission beam, an optical pickup position adjustment part 18 adjusts a position in the horizontal direction of the optical pickup 16 so that a tilt component of a phase wave front of the first and the second emission beams is lowered and the wave front aberration detecting part 6 measures wave front aberration of the first and the second emission beams emitted from the optical pickup 16 whose position in the horizontal direction is adjusted. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009151908(A) 申请公布日期 2009.07.09
申请号 JP20080118751 申请日期 2008.04.30
申请人 PANASONIC CORP 发明人 MATSUZAKI KEIICHI;AIKO HIDEKI;TOMITA HIROTOSHI
分类号 G11B7/22 主分类号 G11B7/22
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