发明名称 |
CONTINUOUS MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE, AND CHAMBER |
摘要 |
PROBLEM TO BE SOLVED: To provide a continuous manufacturing method for a semiconductor device which stabilizes film characteristics immediately after chamber cleaning and provides desired device characteristics even without predeposition, and to provide a chamber for execution of the manufacturing method. SOLUTION: The continuous manufacturing method for the semiconductor device has a step of forming a thin silicon film by plasma CVD. According to this method, chamber cleaning is carried out using F<SB>2</SB>gas without stopping the device. The chamber is made as an aluminum material chamber having a structure such that no angle is formed at the corners of the inner walls of the chamber and each inner wall is made of an aluminum material or an anodized aluminum. COPYRIGHT: (C)2009,JPO&INPIT
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申请公布号 |
JP2009152539(A) |
申请公布日期 |
2009.07.09 |
申请号 |
JP20080228059 |
申请日期 |
2008.09.05 |
申请人 |
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL & TECHNOLOGY |
发明人 |
KARASAWA MINORU;MASUDA ATSUSHI;KONDO MICHIO |
分类号 |
H01L21/205;C23C16/44;H01L21/3065 |
主分类号 |
H01L21/205 |
代理机构 |
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