发明名称 CONTINUOUS MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE, AND CHAMBER
摘要 PROBLEM TO BE SOLVED: To provide a continuous manufacturing method for a semiconductor device which stabilizes film characteristics immediately after chamber cleaning and provides desired device characteristics even without predeposition, and to provide a chamber for execution of the manufacturing method. SOLUTION: The continuous manufacturing method for the semiconductor device has a step of forming a thin silicon film by plasma CVD. According to this method, chamber cleaning is carried out using F<SB>2</SB>gas without stopping the device. The chamber is made as an aluminum material chamber having a structure such that no angle is formed at the corners of the inner walls of the chamber and each inner wall is made of an aluminum material or an anodized aluminum. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009152539(A) 申请公布日期 2009.07.09
申请号 JP20080228059 申请日期 2008.09.05
申请人 NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL & TECHNOLOGY 发明人 KARASAWA MINORU;MASUDA ATSUSHI;KONDO MICHIO
分类号 H01L21/205;C23C16/44;H01L21/3065 主分类号 H01L21/205
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