发明名称 CHARGED PARTICLE BEAM TRAJECTORY CORRECTOR AND CHARGED PARTICLE BEAM APPARATUS
摘要 The invention relates to a trajectory correction method for a charged particle beam, and provides a low-cost, high accuracy and high-resolution converging optical system for use with a charged particle beam to solve problems with conventional aberration correction systems. To this end, the present invention uses a configuration which forms electromagnetic field which is concentrated towards a center of a beam trajectory axis, causes oblique of the beam to make use of lens effects and bend the trajectory, and consequently, cancels out large external side non-linear effects such a spherical aberration of the electron lens. Specifically, the configuration generates an electric field concentration in a simple manner by providing electrodes above the axis and applying voltages to the electrodes. Further, the above configuration can be realized trough operations using lenses and deflectors with incident axes and image formation positions that are normal.
申请公布号 US2009173887(A1) 申请公布日期 2009.07.09
申请号 US20090349708 申请日期 2009.01.07
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 ITO HIROYUKI;SASAKI YUKO;ISHII RYOICHI;DOI TAKASHI
分类号 H01J3/20 主分类号 H01J3/20
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