发明名称 PHOTOMASK, METHOD AND DEVICE FOR CORRECTING LINE WIDTH OF PHOTOMASK, AND ELECTRONIC DEVICE USING THE SAME
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a photomask in which dispersion of line width is accurately corrected, and the line width can be adjusted to fluctuation of an exposing device, a method and device for correcting the line width of a photomask, and an electronic device using the same. <P>SOLUTION: The photomask includes a substrate, and a light shielding film provided on a major surface of the substrate, having a first transmittance in a first area having a first mask line width and having a second transmittance different from the first transmittance in a second area having a second mask line width different from the first mask line width. <P>COPYRIGHT: (C)2009,JPO&INPIT</p>
申请公布号 JP2009151030(A) 申请公布日期 2009.07.09
申请号 JP20070327864 申请日期 2007.12.19
申请人 TOSHIBA CORP 发明人 OKUDA KENTARO;FUJIWARA TAKESHI;HIRANO TAKASHI;SASAKI MITSUO
分类号 G03F1/32;G03F1/36;G03F1/68;G03F1/72;H01L21/027 主分类号 G03F1/32
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