发明名称 METHOD OF FORMING A CONTACT PLUG IN SEMICONDUCTOR DEVICE
摘要 A contact plug forming method for semiconductor devices is provided to improve the step coverage of a sacrificing layer and to prevent the generation of a void. A contact plug forming method for semiconductor devices comprises the following steps. A semiconductor substrate including select lines is prepared. An SAC(self aligned contact) layer(114) is formed along the select lines and the surface of the semiconductor substrate. A sacrificing layer(116a) is formed on the SAC layer. The height of the SAC layer is lowered. The sacrificing layer is transformed to a sacrificial dielectric film. An interlayer insulating film(118) is formed on the sacrificial dielectric film and the SAC layer. A contact hole is formed between select lines. A contact plug(122) is formed inside the contact hole.
申请公布号 KR20090074329(A) 申请公布日期 2009.07.07
申请号 KR20080000077 申请日期 2008.01.02
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, MIN SUB;CHOI, JAE WOOK
分类号 H01L21/28 主分类号 H01L21/28
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