发明名称 |
METHOD OF FORMING A CONTACT PLUG IN SEMICONDUCTOR DEVICE |
摘要 |
A contact plug forming method for semiconductor devices is provided to improve the step coverage of a sacrificing layer and to prevent the generation of a void. A contact plug forming method for semiconductor devices comprises the following steps. A semiconductor substrate including select lines is prepared. An SAC(self aligned contact) layer(114) is formed along the select lines and the surface of the semiconductor substrate. A sacrificing layer(116a) is formed on the SAC layer. The height of the SAC layer is lowered. The sacrificing layer is transformed to a sacrificial dielectric film. An interlayer insulating film(118) is formed on the sacrificial dielectric film and the SAC layer. A contact hole is formed between select lines. A contact plug(122) is formed inside the contact hole.
|
申请公布号 |
KR20090074329(A) |
申请公布日期 |
2009.07.07 |
申请号 |
KR20080000077 |
申请日期 |
2008.01.02 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
LEE, MIN SUB;CHOI, JAE WOOK |
分类号 |
H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|