发明名称 METHOD FOR MANUFCTURING SEMICONDUCTOR DEVICE
摘要 A method for manufacturing a semiconductor device is provided to produce a sacrificing film before forming an insulating film in order to prevent the deformation of the insulating film due to an oxidation process. A method for manufacturing a semiconductor device comprises the following steps. A substrate is selectively etched to form a trench(27) for a recess channel. A sacrificing film is formed on the surface of the trench. The sacrificing film is used up through an oxidation process. A gate insulating film(29) is formed on the surface of the trench in the oxidation process. A gate electrode(30) is formed on the gate insulating film. The gate electrode is formed by reclaiming the trench.
申请公布号 KR20090074341(A) 申请公布日期 2009.07.07
申请号 KR20080000097 申请日期 2008.01.02
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, HAE JUNG;CHO, YONG TAE;KIM, EUN MI
分类号 H01L21/336 主分类号 H01L21/336
代理机构 代理人
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