发明名称 |
METHOD FOR MANUFCTURING SEMICONDUCTOR DEVICE |
摘要 |
A method for manufacturing a semiconductor device is provided to produce a sacrificing film before forming an insulating film in order to prevent the deformation of the insulating film due to an oxidation process. A method for manufacturing a semiconductor device comprises the following steps. A substrate is selectively etched to form a trench(27) for a recess channel. A sacrificing film is formed on the surface of the trench. The sacrificing film is used up through an oxidation process. A gate insulating film(29) is formed on the surface of the trench in the oxidation process. A gate electrode(30) is formed on the gate insulating film. The gate electrode is formed by reclaiming the trench.
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申请公布号 |
KR20090074341(A) |
申请公布日期 |
2009.07.07 |
申请号 |
KR20080000097 |
申请日期 |
2008.01.02 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
LEE, HAE JUNG;CHO, YONG TAE;KIM, EUN MI |
分类号 |
H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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