发明名称 Library test circuit and library test method
摘要 A library test circuit for verifying functions of a plurality of standard cell library logic cells includes a core module including a plurality of standard cell library logic cells, each logic cell having a predetermined number of input vector combinations, the core module outputting test result signals according to a standard cell library; a first switch bank for outputting a first input signal to the core module so as to select cell identifiers corresponding to respective logic cells; and a second switch bank for outputting a second input signal to the core module so as to select pattern identifiers corresponding to input vector combinations of each logic cell.
申请公布号 US7559043(B2) 申请公布日期 2009.07.07
申请号 US20060638367 申请日期 2006.12.14
申请人 DONGBU ELECTRONICS CO., LTD. 发明人 SALGUNAN NITHIN
分类号 G06F17/50 主分类号 G06F17/50
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