发明名称 |
Device and method for measuring jitter |
摘要 |
A test device contains a data pattern generator for providing a delta-sigma-modulated data stream sampled with a sampling frequency fs at its output. A phase modulator generates a test clock subjected to jitter and having the clock frequency ft at its output. The output of the data pattern generator is connected to a terminal for connection to a data input of a semiconductor component to be tested. The output of the phase modulator is connected to a terminal for connection to a clock input of a semiconductor component to be tested. An evaluation device determines the jitter parameters of the input signal at the input of the data device from the low-frequency component of the input signal. In this case, the low-frequency component contains only frequency components of frequencies which are less than half the sampling frequency fs/2.
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申请公布号 |
US7558991(B2) |
申请公布日期 |
2009.07.07 |
申请号 |
US20060440441 |
申请日期 |
2006.05.25 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
MATTES HEINZ;SATTLER SEBASTIAN |
分类号 |
G11B20/20;G01R29/26;G01R31/28;H04B3/26 |
主分类号 |
G11B20/20 |
代理机构 |
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主权项 |
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地址 |
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