发明名称 Learning based logic diagnosis
摘要 A system and method for diagnosing a failure in an electronic device. A disclosed system comprises: a defect table that associates previously studied features with known failures; and a fault isolation system that compares an inputted set of suspected faulty device features with the previously studied features listed in the defect table in order to identify causes of the failure.
申请公布号 US7558999(B2) 申请公布日期 2009.07.07
申请号 US20040709672 申请日期 2004.05.21
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 ADKISSON JAMES W.;COHN JOHN M.;HUISMAN LEENDERT M.;KASSAB MAROUN;PFEIFER PASTEL LEAH M.;SWEENOR DAVID E.
分类号 G01R31/28;G06F11/00;G11C29/00 主分类号 G01R31/28
代理机构 代理人
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