| 摘要 |
There is provided a nonvolatile semiconductor memory device which can read and verify a cell with a negative threshold voltage by biasing voltages of a source line and well line to a positive voltage. The nonvolatile semiconductor memory device includes a voltage control circuit which applies a select gate voltage obtained by adding the biased positive voltage to a voltage set at read time of a cell with a positive threshold voltage to a select gate at a read time and verify time for the cell with the negative threshold voltage.
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