发明名称 Image sensor and method for manufacturing the same
摘要 A method for manufacturing a CMOS transistor includes preparing a silicon substrate provided with a first buried layer, a second buried layer and a body, vertically forming device-isolation films inside the body, forming a first-type well inside the body arranged on the first buried layer, and vertically forming a first source and drain region inside the first-type well, forming a second-type well inside the body arranged on the second buried layer, and vertically forming a second source and drain region inside the second-type well, and vertically forming a recessed gate between the first-type well and the second-type well.
申请公布号 US2009166751(A1) 申请公布日期 2009.07.02
申请号 US20080344503 申请日期 2008.12.27
申请人 KIM MIN-SEOK 发明人 KIM MIN-SEOK
分类号 H01L29/78;H01L21/8238 主分类号 H01L29/78
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