发明名称 TEST APPARATUS AND MEASUREMENT DEVICE
摘要 <p>Disclosed is a test apparatus that tests a device being tested, and which test apparatus is equipped with a performance board on which the device being tested is mounted, a power supply unit that is disposed external to the performance board, receives via a sensing wire an applied voltage to be impressed on the device being tested, and regulates the power supply voltage provided to the device being tested based on the applied voltage that has been received, a voltage level measurement part that receives the applied voltage via a sensing wire inside the power supply unit and measures the voltage value of the applied voltage that has been received, and a decision part that determines the compliance or noncompliance of the device being tested based on the measurement result in the voltage level measurement part.</p>
申请公布号 WO2009081522(A1) 申请公布日期 2009.07.02
申请号 WO2008JP03532 申请日期 2008.11.28
申请人 ADVANTEST CORPORATION;WATANABE, HIROYOSHI 发明人 WATANABE, HIROYOSHI
分类号 G01R31/26 主分类号 G01R31/26
代理机构 代理人
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