| 摘要 |
Embodiments relate to an apparatus that may test a memory device. According to embodiments, a period of memory development may be reduced in a manner of testing a delay of a major part in a memory by adding a simple circuit without using expensive equipment and by which a memory development cost can be lowered. According to embodiments, a memory device may include a memory array and a redundancy memory. According to embodiments, a device may include a programmable redundancy decoder determining a drive force to corresponding to a selection signal, the programmable redundancy decoder outputting the determined drive force to a word line of the redundancy memory and a delay difference generating unit generating a delay difference signal corresponding to a delay difference between first and second word line signals outputted from the redundancy memory. |
