发明名称 |
PLASMA PROCESSING EQUIPMENT |
摘要 |
PROBLEM TO BE SOLVED: To provide a plasma processing apparatus capable of improving wavelength accuracy and accurately monitoring plasma emission. SOLUTION: The plasma processing apparatus includes: an optical fiber 6 for introducing the plasma emission generated inside the plasma processing apparatus; a diffraction grating 9 for dividing the plasma emission introduced through the optical fiber into a plurality of spectrums; photodetectors 10 in a row for detecting the emission intensities of the spectrums divided with the diffraction grating for each spectrum; and a signal processor 12 for computing a plasma emission wavelength on the basis of a prescribed operational expression on the basis of the detection outputs of the photodetectors in a row. The signal processor compares the theoretical spectrum wavelength of a processing gas to be used in plasma processing or a material to be processed with a spectrum wavelength obtained when processing the material to be processed using the processing gas and corrects the operational expression on the basis of the compared result. COPYRIGHT: (C)2009,JPO&INPIT
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申请公布号 |
JP2009147207(A) |
申请公布日期 |
2009.07.02 |
申请号 |
JP20070324625 |
申请日期 |
2007.12.17 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORP |
发明人 |
NAKAMOTO SHIGERU;UCHIDA HIROSHIGE |
分类号 |
H01L21/3065 |
主分类号 |
H01L21/3065 |
代理机构 |
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