发明名称 INTEGRATED CIRCUIT AND MANUFACTURING PROCESS FACILITATING SELECTIVE CONFIGURATION FOR ELECTROMAGNETIC COMPATIBILITY
摘要 An integrated circuit (IC) having a selectively-designated electromagnetic compatibility (EMC) performance characteristic. The IC includes an IC die having an input or output (I/O) node. A first I/O cell of a first type associated with the I/O node provides a first EMC performance characteristic, and a second I/O cell of a second type associated with the I/O node provides a second EMC performance characteristic different from the first EMC performance characteristic. A first bonding pad is electrically coupled with the first I/O cell, and a second bonding pad is electrically coupled with the second I/O cell. The IC die can be packaged into a packaged IC having an I/O pin corresponding to the I/O node. The I/O pin is wired to one of either the first bonding pad or the second bonding pad, but not to the other, such that a pinout for the I/O node is preferentially provided having one of either the first EMC performance characteristic or the second EMC performance characteristic.
申请公布号 US2009166679(A1) 申请公布日期 2009.07.02
申请号 US20070967880 申请日期 2007.12.31
申请人 PATERNOSTER PAUL;SABHARANJAK VAIBHAVI;LAI PO-SHEN 发明人 PATERNOSTER PAUL;SABHARANJAK VAIBHAVI;LAI PO-SHEN
分类号 H01L27/10;G03F1/00;H01L21/60 主分类号 H01L27/10
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