发明名称 Non-Volatile Memory Cell Circuit With Programming Through Band-To-Band Tunneling And Impact Ionization Gate Current
摘要 Electronic circuitry is described having a first transistor having a first gate dielectric located between an electrically floating gate and a semiconductor substrate. The first injection current flows through the first gate dielectric to establish a first amount of electrical charge on the gate electrode. The electronic circuitry also includes a second transistor having a second gate dielectric located between the gate electrode and the semiconductor substrate. A band-to-band tunneling current flows between valence and conduction bands of the second transistor to create a second injection current that flows through the second gate dielectric to establish the first amount of electrical charge on the gate electrode. Non-volatile memory cell circuits having the above described circuitry are also described.
申请公布号 US2009170260(A1) 申请公布日期 2009.07.02
申请号 US20090403333 申请日期 2009.03.12
申请人 VIRAGE LOGIC CORPORATION 发明人 HORCH ANDREW E.
分类号 H01L21/8239 主分类号 H01L21/8239
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