TEST JIG FOR TEMPERATURE COMPENSATED CRYSTAL OSCILLATOR AND TEST PANEL HAVING THE SAME,申请号KR20080015081U-传众专利搜索

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发明名称	TEST JIG FOR TEMPERATURE COMPENSATED CRYSTAL OSCILLATOR AND TEST PANEL HAVING THE SAME
摘要
申请公布号	KR20090006721(U)	申请公布日期	2009.07.02
申请号	KR20080015081U	申请日期	2008.11.12
申请人		发明人
分类号	G01R31/00;G01R31/317	主分类号	G01R31/00
代理机构		代理人
主权项
地址

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