发明名称 |
ERASING METHOD AND SOFT PROGRAMMING METHOD OF NON VOLATILE MEMORY DEVICE |
摘要 |
An erasing method and a soft programming method of a nonvolatile memory device are provided to prevent disturbance margin reduction of a memory cell adjacent to a selection transistor by preventing soft program about the memory cell adjacent to the selection transistor. An erasing operation about a memory cell block is performed(310). A hard erasing verification about the memory cell block is performed(320). A soft program operation about the memory cell block is performed(330). A soft program operation about an outermost cell is not performed. A verifying operation about the soft program operation is performed(340). A soft erasing verification about the memory cell block is performed(350). A disturbing stress test about the memory cell block is performed(360). A verifying operation about the disturbing stress test is performed(370).
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申请公布号 |
KR20090072139(A) |
申请公布日期 |
2009.07.02 |
申请号 |
KR20070140147 |
申请日期 |
2007.12.28 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
JEON, YOO NAM |
分类号 |
G11C16/34;G11C16/10;G11C16/12 |
主分类号 |
G11C16/34 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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