发明名称 ERASING METHOD AND SOFT PROGRAMMING METHOD OF NON VOLATILE MEMORY DEVICE
摘要 An erasing method and a soft programming method of a nonvolatile memory device are provided to prevent disturbance margin reduction of a memory cell adjacent to a selection transistor by preventing soft program about the memory cell adjacent to the selection transistor. An erasing operation about a memory cell block is performed(310). A hard erasing verification about the memory cell block is performed(320). A soft program operation about the memory cell block is performed(330). A soft program operation about an outermost cell is not performed. A verifying operation about the soft program operation is performed(340). A soft erasing verification about the memory cell block is performed(350). A disturbing stress test about the memory cell block is performed(360). A verifying operation about the disturbing stress test is performed(370).
申请公布号 KR20090072139(A) 申请公布日期 2009.07.02
申请号 KR20070140147 申请日期 2007.12.28
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JEON, YOO NAM
分类号 G11C16/34;G11C16/10;G11C16/12 主分类号 G11C16/34
代理机构 代理人
主权项
地址