ANALOG SCAN CIRCUIT, ANALOG FLIP-FLOP, AND DATA PROCESSING DEVICE

摘要

It is possible to improve observation and controllability in an analog LSI test. Analog signals inputted from an input terminal (IN1 to IN3) are supplied via transistors (301 to 303) to diffusion layer regions (221, 223, 225) and accumulated as an electric charge. A clock signal is supplied to signal lines (121, 122) which are alternately connected to gate electrodes (211 to 216) so as to transfer the accumulated electric charge rightward. The diffusion layer regions (221, 223, 225) are connected to electric charge/voltage conversion amplifiers (411 to 413). The accumulated electric charge is converted into voltage and outputted as an analog signal to output terminals (VOUT1 to VOUT3). The diffusion layer region (220) is connected to a scan-in terminal Sin. The diffusion layer region (225) is connected via an electric charge/voltage conversion amplifier (401) to a scan out terminal (Sout).