发明名称 Signalerzeugungsvorrichtung, Prüfvorrichtung und Schaltungsanordnung
摘要 <p>Provided is a test apparatus that tests a device under test, comprising a test signal generating section that generates a test signal to be applied to the device under test; a first driver that is electrically connected to a terminal of the device under test and that supplies the test signal to the terminal of the device under test; a correction signal generating section that generates a correction signal for correcting attenuation of the test signal occurring until the test signal reaches the terminal of the device under test; and a second driver that is electrically connected to the terminal of the device under test and that supplies the correction signal to the terminal of the device under test.</p>
申请公布号 DE112007001984(T5) 申请公布日期 2009.07.02
申请号 DE20071101984T 申请日期 2007.05.28
申请人 ADVANTEST CORP. 发明人 WATANABE, DAISUKE;OKAYASU, TOSHIYUKI
分类号 H04L25/03;G01R31/28 主分类号 H04L25/03
代理机构 代理人
主权项
地址