发明名称 |
Signalerzeugungsvorrichtung, Prüfvorrichtung und Schaltungsanordnung |
摘要 |
<p>Provided is a test apparatus that tests a device under test, comprising a test signal generating section that generates a test signal to be applied to the device under test; a first driver that is electrically connected to a terminal of the device under test and that supplies the test signal to the terminal of the device under test; a correction signal generating section that generates a correction signal for correcting attenuation of the test signal occurring until the test signal reaches the terminal of the device under test; and a second driver that is electrically connected to the terminal of the device under test and that supplies the correction signal to the terminal of the device under test.</p> |
申请公布号 |
DE112007001984(T5) |
申请公布日期 |
2009.07.02 |
申请号 |
DE20071101984T |
申请日期 |
2007.05.28 |
申请人 |
ADVANTEST CORP. |
发明人 |
WATANABE, DAISUKE;OKAYASU, TOSHIYUKI |
分类号 |
H04L25/03;G01R31/28 |
主分类号 |
H04L25/03 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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