APPARATUS AND METHOD FOR INSPECTING SOLDER BUMP FORMATION AND TRANSFER STATE USING ELECTRON BEAM IN WAFER BUMPING PROCESS
摘要
An apparatus and a method for inspecting solder bump formation and transfer state using an electron beam are provided to sense a back scattered electronic by using an electron beam discharging unit. An electron beam emission unit(11) like an electron gun emits an electronic beam to an object(19), and a deflection and acceleration unit(12) perform deflection and acceleration of the electronic beam. A detector(13) senses an electron emitted from the object and converts it into an electrician signal. A signal process unit(14) generates arrangement information of metal material formed on the object by processing an electrical signal from the detector.
申请公布号
KR20090069838(A)
申请公布日期
2009.07.01
申请号
KR20070137646
申请日期
2007.12.26
申请人
ADP ENGINEERING CO., LTD.
发明人
CHOI, EUN YOUL;LIM, YONG JIN;RHEE, HO DUCK;CHA, JUNG HAG